Required fields are marked *.
Name *
Email *
Phone *
Required fields are marked *.
Name *
Email *
Phone *
Product Detail
Complaint Nature
Laser Raman Spectrophotometer Laser Raman Spectrophotometer
Potentiostat/Galvanostat Potentiostat/Galvanostat
Battery Charge/Discharge System Battery Charge/Discharge System
Fluorescence Life Time Particle Size Analyzer
Fluorescence Life Time Fluorescence Life Time
Nanoindenters Nanoindenters
UV VIS Spectrophotometer UV VIS Spectrophotometer
Spectroradiometer Spectroradiometer

Photovoltaics > Flash QE / EL / PL


Quantum Efficiency

Tau Science is revolutionizing how Quantum Efficiency (QE) measurements are done. Our FlashQE system utilizes an innovative solid state light engine which simultaneously measures broadband reflectance, Internal QE, and External QE in one second. The speed of the technique enables it to be used for unique applications such as spatial mapping of full spectrum QE at 40 sites/ minute and time resolved study of QE degradation under environmental stressors. The entire QE mapping can be done for 156 x 156 cm cell in 10-15mins. Light soaking experiments can also be done. Jsc mapping for the entire cell can be done.




IRIS - Inline Hotspot Inspection

First released in 2009, Tau Science’s IRIS product line screens for electrical shunt defects in cells which will lead to localized hotspots – a leading cause of PV cell performance problems and module degradation. Tau Science was the first company to bring a turnkey hotspot inspection system to the market and has built up years of experience delivering solutions to PV manufactures around the world. We continue to lead this field with the second generation product, introduced in 2011, that sets new standards of precision and accuracy at throughputs exceeding 3000 cells per hour.



PixEL - Electroluminescence and Photoluminescence

Tau Science’s new PixEL™ is a versatile, turnkey imaging platform capable of Photoluminescence and/or Electroluminescence. System is complete with high sensitive, low noise, cooled camera. System is equipped with  30W laser , 800nm as standard and 60W& 120 W as options. The 800nm laser shines on the sample reflected and luminescent light reaches the filter where reflected light is cut off by high pass filters. An InfraRed sensitive imaging camera captures the event to give PL image. Necessary sample stage, enclosures and software are provided.

Two more camera options are provided to meet additional customer requirements- a 4.2MP camera is tuned for maximum sensitivity from  380-700nm, and a second 1MP deep depletion camera is tuned for maximum sensitivity from 700-1050nm. Automated XY stage and various FOV lenses are also available. PL images give the idea about uniformity and deterioration of coated surface over a period of time, and may be used on unfinished solar cells even before metal contacts are applied.

Electroluminescence option is also quoted which is used on completed solar cells that have full metallization.  EL detects many of the same items as PL, and in addition it is used to investigate problems with cell contacts..

Construction of the instrument
Upto four lasers can be used 30W,60W or 120W Homogenizer to Illuminate the light uniformly on the sample, band pass filter to cut off the reflected light, high sensitive – low noise InGaAs camera. Kindly look at the table below which shows options of various cameras available.



The platform can be tailored, with a range of cameras and supporting features, to maximize performance on your unique material system, sample size, and budget. The architecture is modeled after the PL/EL system developed and used by Johnston et al at the National Renewable Energy Laboratory in Golden, Colorado. R&D labs that need to measure challenging, weakly luminescent samples will find that this system exhibits industry-leading sensitivity and signal to noise ratio.


Si  cells, CIGS cells etc.can be measured.  Shows  luminescence beyond 950nm  to see the grain boundaraies, micro-cracks and other defects the camera should have high QE and low noise levels beyond 950nm. (the ratio of QE : noise should be high for better quality imaging)


Comparison of various Cameras





Copyright © 2015 Sinsil International. All Rights Reserved.
Web Site Designed By V Kreate