Stimulated Emission Depletion (STED) is a powerful super resolution microscopy technique that allows for the observation of fluorescence structures with spatial resolution below the diffraction limit. The Alba STED uses the pulsed excitation and pulsed emission approach (pSTED) to achieve lateral resolution of 60 – 100 nm. An additional increase on the resolution is provided by the lifetime information acquired through FastFLIM (the digital frequency domain lifetime imaging) and using the phasor plot: the photons emitted by the fluorophores activated by the excitation laser only (inherent fluorescence decay) are efficiently separated from the photons emitted by the fluorophores partially or fully activated by the STED laser (featuring shorter decay times). A resolution of 30 nm is measured on standard samples. Moreover, the combination of pSTED and lifetime analysis through the phasor plot allows to separate two fluorophores featuring similar emission patterns but having different decay times (dual label excitation).