CS Instruments, France
Nano-Observer AFM
The Nano-Observer AFM microscope is a flexible and powerful AFM. Designed with the ultimate technologies, it combines performance and ease of use. The USB controller offers a real integrated lock- in for better measurement capability (phase detection, Piezo-Response Mode…).
A low-noise laser and a pre-alignment system provide simplicity and high resolution on a compact AFM head. Its intuitive software simplifies all Atomic Force Microscope settings to allow quick and safe AFM acquisitions.
Compact and robust, the Nano-Observer Atomic Force Microscope fulfills the requirements for advanced users or beginners. It avoids laser alignment with the pre-positioned tip system. A top and side view of the tip/sample, combined with vertical motorized control, makes the pre-approach easy.
Application
- Material characterization
- Polymer science
- Electrical characterizatio
- Semiconductor
- Soft sampl
- Biology
ResiScope mode
The BEST tool for AFM Electrical Characterization Resistance & Current mapping (10 orders of magnitude) High sensitivity over the full range Compatible with :
Oscillating mode / AC mode EFM / MFM or HD-KFM
Output information
- R
- Log R
- Current
- I/V spectroscopy
Applications :
- Photovoltaic cells
- Semiconductors
- Coatings, oxydes, materials
- All conductive characterization
HD-KFM
HD-KFM is characterized because the electric feedback is tuned to the second eigenmode frequency of the cantilever. HD-KFM is based the first flexural eigenmode of the cantilever is excited mechanically and the second flexural mode is excited electrically. In the past decade, multi-frequency approach has become one of the front-end topics amongst the AFM community as it has shown many potential applications
- One pass – NO LIFT : Very high sensitivity & higher spatial resolution
- Surface potential mapping
- 2nd lock-in amplifier
- Applications:
- Materials, semiconductors, batteries…
GALAXY DUAL controller
New opportunities with 5100/ 5500/ Multimode, AFM/STM bases
The GALAXY DUAL controller creates new opportunities for AFM users by combining new features with those already available on your existing AFM. This new controller offers more than a second life to your AFM, it renews and improves the performance with new imaging modes and new intuitive software.
The GALAXY DUAL USB controller offers a real integrated lock-in for better measurement capability (phase detection, field measurement…). Low-noise electronics and power supply coupled to a 24bit drive architecture provides high resolution and smart integration.
Keep your existing AFM modes:
The dual galaxy controller has been designed to be fully compatible with:
– Multimode AFM
– Pico SPM (STM)
– 5100 AFM
– 5500 AFM
– STM, Contact, AC, Phase, MFM/ EFM/ PFM,/LFM, EC modes
Specification
- XY scan range 100 μm (tolerance +/- 10%)
- Z range 15 μm (tolerance +/- 10%)
- XY drive resolution 24 bit control – 0.06 Angströms
- Z drive resolution 24 bit control – 0.006 Angströms
- Ultra low noise HV Typ : <0.01 mV RMS
- 6 DAC Outputs 6 D/A Converters – 24 bit
(XYZ drive, bias, aux…) - 8 ADC Inputs 8 A/D Converters – 16 bit
- Data points Up to 8192
- Integrated Lock-in Up to 6 MHz (software limited)
- 2nd lock-in (6 MHz-optional)
- Interface USB (2.0 – 3.0 compatible)
- Controller Power AC 100 – 240 V – 47-63 Hz
- Operating System Windows 7 to 10
