CS Instruments, France
Nano-Observer AFM
Application
- Material characterization
- Polymer science
- Electrical characterizatio
- Semiconductor
- Soft sampl
- Biology
ResiScope mode
Applications :
- Photovoltaic cells
- Semiconductors
- Coatings, oxydes, materials
- All conductive characterization
HD-KFM
- One pass – NO LIFT : Very high sensitivity & higher spatial resolution
- Surface potential mapping
- 2nd lock-in amplifier
- Applications:
- Materials, semiconductors, batteries…
GALAXY DUAL controller
Specification
- XY scan range 100 μm (tolerance +/- 10%)
- Z range 15 μm (tolerance +/- 10%)
- XY drive resolution 24 bit control – 0.06 Angströms
- Z drive resolution 24 bit control – 0.006 Angströms
- Ultra low noise HV Typ : <0.01 mV RMS
- 6 DAC Outputs 6 D/A Converters – 24 bit
(XYZ drive, bias, aux…
