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Thinfilm-metrology

Ellipsometer

Variable Angle Spectroscopic Ellipsometer, In Situ Measurement, Transmission, Reflection, Diode array sensors, Low & High Temp. Electrochemistry, EQCM, Variable Angle.

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Thin Film Measurement System

Ttable top mapping and insitu version.Visible : 15nm to 70 um, 380nm - 1050nm UV : 1nm to 70um, 200nm - 1100nm NIR : 100nm to 250um, 950nm - 1700nm

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