ALPHA 2.0 ELLIPSOMETER

Download Brochure The alpha 2.0 is a budget-friendly option for routine measurements of thin film thickness and refractive index. A compact footprint and simple design make the alpha 2.0 easy to use while harnessing the power of spectroscopic ellipsometry. It was designed for ease-of-use: simply place the sample on the stage, choose the model that matches your film, click “measure”, and you will have results within seconds. Ellipsometer Configuration: Dual-Rotation optical design Wavelength Range: 400-1000 nm Number of Wavelengths: 190 Detector: CCD Angles of Incidence: 65°, 70°, 75° or 90° (straight-through) Data Acquisition Rate (Complete Spectrum): 5-10 sec. (typical) Sample Size: The alpha 2.0 accommodates samples up to 200-mm diameter and 16-mm thick. Power Requirements: 100/240 VAC, 47-63Hz, <1 Amp Dimensions: Width 20″ / Depth 13″ / Height 12   Alpha SE   Accessories  Liquide Cell / QCM