F20 Series Film Thickness Measurement Systems

Download Brochure F20s are general-purpose film thickness measurement instruments, and are used in thousands of applications worldwide. Thickness and refractive index can be measured in less than a second. Like all of our thickness measurement instruments, the F20 connects to the USB port of your Windows® computer and sets up in minutes. The different F20 instruments are distinguished primarily by the thickness measurement range, which in turn is determined by the instrument's wavelength range. The standard F20 is our most popular product. Generally shorter wavelengths (e.g. F20-UV) are required for thinner films, while longer wavelengths allow measurement of thicker, rougher, and more opaque films.

Model Specifications:

Model  Thickness Range  Wavelength Range
F20 15nm - 70µm 380-1050nm
F20-EXR 15nm - 250µm 380-1700nm
F20-NIR 100nm - 250µm 950-1700nm
F20-UV 1nm - 40µm 190-1100nm
F20-UVX 1nm - 250µm 190-1700nm
F20-XT 0.2µm - 450µm 1440-1690nm
F3-sX Series 10µm- 3mm 960-1580nm
*film stack dependent   The Filmetrics F20 includes following accessories for measurements:
  • Integrated Spectrometer/Light Source Unit
  • FILMeasure 9.0 software
  • FILMeasure standalone software for remote data analysis
  • Thickness Standard
  • Reflectance standard
  • Spare TH-1 Lamp
  • SS-3 sample stage with fiber optic cable
  • Connecting cables 
Common Optional Accessories
  • Sample Cam
  • StageBase-XY10-AUTO100MM
  • Multi Value Thickness standard 
  • NIST-Traceable Thickness Standard
  • Contact Probe
  • Carrying Case 

Sinsil International

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