The Nano-Observer AFM microscope is a flexible and powerful AFM. Designed with the ultimate
technologies, it combines performance and ease of use. The USB controller offers a real integrated lock-
in for better measurement capability (phase detection, Piezo-Response Mode…).
A low-noise laser and a pre-alignment system provide simplicity and high resolution on a compact AFM
head. Its intuitive software simplifies all Atomic Force Microscope settings to allow quick and safe AFM
acquisitions.
Compact and robust, the Nano-Observer Atomic Force Microscope fulfills the requirements for
advanced users or beginners. It avoids laser alignment with the pre-positioned tip system. A top and
side view of the tip/sample, combined with vertical motorized control, makes the pre-approach easy.
Applications
- Material characterization
- Polymer science
- Electrical characterization
- Semiconductor
- Soft sample
- Biology
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