R50/R54-Series Sheet Resistance Mapping

The 4PP contact four-point probe configuration is recommended for thin metal and ion implant layers, and the non-contact Eddy Current (EC) probe is recommended for thicker metal layers and soft or flexible conductive surfaces

Download Brochure

Sinsil International

Contact Now

Share On

Facebook
WhatsApp
LinkedIn
Description

R50/R54-Series
Sheet Resistance Mapping

The 4PP contact four-point probe configuration is recommended for thin metal and ion implant layers, and the non-contact Eddy Current (EC) probe is recommended for thicker metal layers and soft or flexible conductive surfaces

Measurement Range 1mΩ/sq –
200MΩ/sq/ 1mΩ/sq – 50Ω/sq

Reviews (0)
0 reviews
0
0
0
0
0

Reviews

Clear filters

There are no reviews yet.

Be the first to review “R50/R54-Series Sheet Resistance Mapping”

Your email address will not be published. Required fields are marked *

1 2 3 4 5
1 2 3 4 5
1 2 3 4 5

Shipping & Delivery

Related Products

Compare

FTIR-7600S Fourier Transform Infrared Spectrometer

Add to wishlist
Read more
Quick view
Compare

F30 Thickness Measurement Instrument Series

Add to wishlist
Read more
Quick view
Compare

Neware Battery tester

Add to wishlist
Read more
Quick view
Compare

Pika IR

Add to wishlist
Read more
Quick view
Compare

F10RT

Add to wishlist
Read more
Quick view
Compare

Software

Add to wishlist
Read more
Quick view