Transmission DHM
Download Brochure Reflection DHM measures the reflected wavefront from the sample, i. e. the surface topography in the case of a purely reflecting sample. DHM® is more than a standard optical profilometer as it enables dynamic measurement within vertical ranges from nanometers to hundreds of microns with sub-nanometric vertical resolution. Applications: Surface topography Surface finish Defect inspection Structured thin film MEMS measurement
Sinsil International
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