The alpha 2.0 is a budget-friendly option for routine measurements of thin film thickness and refractive index. A compact footprint and simple design make the alpha 2.0 easy to use while harnessing the power of spectroscopic ellipsometry. It was designed for ease-of-use: simply place the sample on the stage, choose the model that matches your film, click “measure”, and you will have results within seconds.
Ellipsometer Configuration: Dual-Rotation optical design
Wavelength Range: 400-1000 nm
Number of Wavelengths: 190
Detector: CCD
Angles of Incidence: 65°, 70°, 75° or 90° (straight-through)
Data Acquisition Rate (Complete Spectrum): 5-10 sec. (typical)
Sample Size: The alpha 2.0 accommodates samples up to 200-mm diameter and 16-mm thick.
Power Requirements: 100/240 VAC, 47-63Hz, <1 Amp
Dimensions: Width 20″ / Depth 13″ / Height 12
Alpha SE Accessories
Liquide Cell / QCM
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