ALPHA 2.0 ELLIPSOMETER

  • Dual-Rotation, 400-1000 nm
  • 190 Detector CCD
  • Manual Angles of Incidence 65°, 70°, 75° or 90° (straight-through)

Sinsil International

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Description

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The alpha 2.0 is a budget-friendly option for routine measurements of thin film thickness and refractive index. A compact footprint and simple design make the alpha 2.0 easy to use while harnessing the power of spectroscopic ellipsometry. It was designed for ease-of-use: simply place the sample on the stage, choose the model that matches your film, click “measure”, and you will have results within seconds.

Ellipsometer Configuration: Dual-Rotation optical design

Wavelength Range: 400-1000 nm

Number of Wavelengths: 190

Detector: CCD

Angles of Incidence: 65°, 70°, 75° or 90° (straight-through)

Data Acquisition Rate (Complete Spectrum): 5-10 sec. (typical)

Sample Size: The alpha 2.0 accommodates samples up to 200-mm diameter and 16-mm thick.

Power Requirements: 100/240 VAC, 47-63Hz, <1 Amp

Dimensions: Width 20″ / Depth 13″ / Height 12

 

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